Lab. Equipments

Atomic Absorption Spectrometer (AAS)

Quantitative analysis and determination of atomic concentration in materials

  • Model: AAnalyst 400
  • Company: PerkinElmer

Working Mode

  • Absorption and Emission

Range of the Application

  • Background of Engineering
  • Fundamental Science
  • Agriculture
  • Mineral Engineering
  • Medical
  • Metallurgy

Conditions of the Sample

  • Solutions

Detection limit of instrument

For most elements is at ppm

Fourier Transform Infrared Spectroscopy (FTIR)

Model: spectrum 400

Company: PerkinElmer

Country: US

Working Mode:

  • Mid, Far
  • Absorption , transmission

Model: VECTOR33

Company: Bruker

Country: Germany

Working Mode:

  • Mid
  • Absorption , transmission

Model: spectrum RXI

Company: PerkinElmer

Country: US

Working Mode:

  • Mid
  • Absorption , transmission, reflectance

Typical Applications of FTIR

  • Identification of simple mixtures of organic and inorganic compounds both as solids or liquids.
  • Identification of polymers and polymer blends .
  • Indirect verification of trace organic contaminants on surfaces.
  • Thin film analysis.
  • Analysis of adhesives, coatings and adhesion promoters or coupling agents .
  • Solvent extractions of leachables or contaminants, plasticizers, mould release agents and weak boundary layers coupled with XPS surface chemical analysis techniques .
  • Identification of rubbers and filled rubbers.
  • Determination of degrees of crystallinity in polymers (eg.: LDPE and HDPE).
  • Extent of thermal, UV or other degradation or depolymerisation of polymers and paint coatings.
  • Analysis of unknown solvents, cleaning agents and detergents.

Conditions of the Sample

  • Non-aqueous solution
  • Solid or powder

UV-VIS Spectrometer

  • Model: Lambda 25
  • Company: PerkinElmer

Working Mode

Scan، Time Drive (Td) ، Wave PROG، Concentration

Rang of the application

  • Polymer solutions
  • Semiconductors
  • Biology

 Conditions of the Sample

  • Transparent coated thin films with dimension of 1 × 15 × 30 mm
  • Limitation of non transparent thin films, metals and silicon substrates
  • Transparent liquid samples with the standard samples, sample volume of 50 ml

Application of instrument

  • The measure of the qualitative and quantitative of the composition, based on the absorption of solutions in ultraviolet and visible areas ranging from 190 to 1100 nm
  • Measurement of light transparency in solutions, compounds and transparent substrates
  • Study of the optical properties of semiconductors for Band gap calculation
  • Quantitative measurement of various analyses such as intermediate metal ions , conjugated organic compounds
  • Study of drug interactions with biological compounds

Horizontal Dilatometer Instrument

  • Model: AAnalyst 402
  • Company: netzsch

Field of applications:

  • Liner thermal expansion (ΔL)
  • Determination of thermal expansion coefficient
  • Determination of glass transition (Tg)

   Technical Specifications:

  • Sample Length (47-49 mm)
  • Sample Diameter (3-5 mm)
  • Heating rate (10 ) °C/min
  • Furnace temperature ( 1200 °C)
  • Atmosphere control (Air, Argon)    

Simultaneous Thermal Analysis Instruments

PL- STA 1640 (England)

  • BÄHR – STA 503 (Germany)

Field of applications:

  • Melting point Measurement
  • Sublimation and Evaporation point Measurements
  • Phase changes Determination
  • Thermal decomposition
  • Solid state reactions
  • Metal corrosion Studies

   Technical Specifications:

  • Special Alumina crucible are used in each analysis
  • Only Solid Samples could be Analyzed
  • Heating rate could be selected between 5-20 °C/min
  • Maximum Furnace temperature: 1200 °C
  • Atmosphere control (Air, Argon)    



  • High-Resolution
  • Computer-Controlled
  • Programmable

Key features

  • Electrode connections2, 3 and 4
  • Potential range+/- 10 V
  • Compliance voltage+/- 30 V
  • Maximum current+/- 1 A
  • Current ranges1 A to 10 nA
  • Potential accuracy+/- 0.2 %
  • Potential resolution300 or 30 µV
  • Current accuracy+/- 0.2 %
  • Current resolution0.0003 %
  • Input impedance>100GΩ // < 8 pF
  • Potentiostat bandwidth4 MHz


  • Model: mini-II
  • Company: Belsorp

Measurement principle

  • Volumetric gas adsorption method +AFSM


  • N2, Ar, CO2, H2 and other non-corrosive gases

Analysis port

  • High accuracy mode: 3 ports
    Standard mode: 2 ports

Specific surface area

Pore size distribution

Pressure transducer

  • 133 kPa (1000Torr)   5 units

Dewar vessel

  • Volume: 2L
    Holding time: 30H


  • Up to 3 samples can be measured independently and simultaneously.
  • Pore sizes of 0.35 to 200 nm in diameter can be measured.
  • Specific surface areas as low as 0.01 m2/g can be measured.


  • Model :SE800 DUV
  • Company :SENTECH
  • country : Germany
  • Simulation software :SpectraRay II

Range of application

Ability to work in a wavelength range of 190 nm to 950 nm (UV/Vis)

Condition of the Samples

  • The thickness of the sample (thin film + substrate) should be up to 7 mm and sample diameter up to 20 cm.

Output data

  • Ellipsometry Diagrams angles ψ and Δ versus wavelength.

Simulation data

  • Graphs index of refraction and distinction coefficient versus wavelength
  • Dielectric function versus wavelength
  • Thickness

Spark plasma sintering furnace (SPS)

  • Model: EF 120311
  • Company: Easy fashion
  • Country: china

Range of the application

  • Simultaneous pressing and sintering up to 20 tons pressure and 2000 C heating
  •  Fast Sintering,
  • High Density

Conditions of the Sample

  • Ceramic, metallic or composite powders
  • Final samples have 1-8 cm diameters and up to 2 cm height

Imam Khomeini Blvd, Meshkin-Dasht, Karaj,
IRAN, Islamic Republic of Iran
P.O. Box: 31787-316
Phone: +98-26-36280040-9
Fax: +98-26-36201888